By Chao Huang

Powerful Nano-Computing specializes in a variety of problems with powerful nano-computing, defect-tolerance layout for nano-technology at assorted layout abstraction degrees. It addresses either redundancy- and configuration-based equipment in addition to fault detecting innovations in the course of the improvement of actual computation versions and instruments. The contents current an insightful view of the continued researches on nano-electronic units, circuits, architectures, and layout equipment, in addition to offer promising instructions for destiny learn.

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Extra resources for Robust Computing with Nano-scale Devices: Progresses and Challenges (Lecture Notes in Electrical Engineering)

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1, March 2004, pp. 187–201. 39. Pradhan, D. (editor), “Fault-Tolerant Computer System Design,” Prentice Hall, 1996. 40. Pradhan, D. , “Roll-Forward Checkpointing Scheme: A Novel fault-Tolerant Architecture” IEEE Transactions on Computers, vol. 43, no. 10, October 1994, 1163–1174. 41. , “Markov chains and probabilistic computation – a general framework for multiplexed nanoelectronic systems,” IEEE Transactions on Nanotechnology, vol. 4, no. 2, March 2005, pp. 194–205. 42. , “Integrated Reliability Modeling Environment,” Reliability Engineering and System Safety, Elsevier Science Limited; UK, Volume 65, Issue 1, March 1999, pp.

Both AND and OR bridging defects were injected equally. It should be observed that for injecting m defective transistors due to bridges, only m=2 bridges need to be injected. Table 4 shows the results obtained for several percentages of injected bridging defects. As can be seen, the quadded-transistor technique exhibits a much lower failure probability than quadded-logic technique. Quadded-transistor technique achieves failure rates lower than quadded-logic for the same and twice the percentage of injected bridging faults.

While the quadded-transistor structure increases the area, this increase is less than other gate-level defect tolerance techniques as will be shown in the experimental results. As with all defect tolerance techniques, the increase in area, power and delay is traded off by more circuit reliability. This is justified given that it is predicted that nanotechnology will provide much higher integration densities, speed and power advantages. Table 1 Area, delay and power values of basic 0:5  cells designed using quadded-transistor structure (Fig.

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